Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)1 Scope This part of IEC 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This

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Contents of BS EN ISO 25539-2 include:

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variations in time

— essential non-thermal output characteristics of ultrasonic dental descalers

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Chemical and physical properties

Welding and allied processes generate fume and gases